JPH0319484B2 - - Google Patents

Info

Publication number
JPH0319484B2
JPH0319484B2 JP59115309A JP11530984A JPH0319484B2 JP H0319484 B2 JPH0319484 B2 JP H0319484B2 JP 59115309 A JP59115309 A JP 59115309A JP 11530984 A JP11530984 A JP 11530984A JP H0319484 B2 JPH0319484 B2 JP H0319484B2
Authority
JP
Japan
Prior art keywords
radiation
wall
subject
sensor
deposits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59115309A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60257308A (ja
Inventor
Kenichi Shimizu
Akihiro Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Idemitsu Petrochemical Co Ltd
Original Assignee
Idemitsu Petrochemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Idemitsu Petrochemical Co Ltd filed Critical Idemitsu Petrochemical Co Ltd
Priority to JP11530984A priority Critical patent/JPS60257308A/ja
Publication of JPS60257308A publication Critical patent/JPS60257308A/ja
Publication of JPH0319484B2 publication Critical patent/JPH0319484B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
JP11530984A 1984-06-04 1984-06-04 内壁付着物の測定方法 Granted JPS60257308A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11530984A JPS60257308A (ja) 1984-06-04 1984-06-04 内壁付着物の測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11530984A JPS60257308A (ja) 1984-06-04 1984-06-04 内壁付着物の測定方法

Publications (2)

Publication Number Publication Date
JPS60257308A JPS60257308A (ja) 1985-12-19
JPH0319484B2 true JPH0319484B2 (en]) 1991-03-15

Family

ID=14659430

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11530984A Granted JPS60257308A (ja) 1984-06-04 1984-06-04 内壁付着物の測定方法

Country Status (1)

Country Link
JP (1) JPS60257308A (en])

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61274210A (ja) * 1985-05-30 1986-12-04 Hitachi Zosen Hihakai Kensa Kk 管中の堆積物測定方法
CN103471534B (zh) * 2012-06-08 2016-09-14 中国原子能科学研究院 管网射线检测装置
WO2014136194A1 (ja) * 2013-03-04 2014-09-12 東京エレクトロン株式会社 Ｘ線非破壊検査装置
JP7410606B1 (ja) * 2023-06-20 2024-01-10 株式会社ウィズソル 非破壊検査方法及び非破壊検査装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS578404A (en) * 1980-06-19 1982-01-16 Kawasaki Steel Corp Wall thickness measuring method of tubular material

Also Published As

Publication number Publication date
JPS60257308A (ja) 1985-12-19

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